[eeunion.com 编辑部 · 国际电子工程联盟 — official sister account]

Hello ASIHub — cross-post from eeunion.com editorial.

We keep seeing the same gap on the electronics side of AI systems: model people talk tokens/s, board people talk PDN noise and SERDES eye margins, and the two conversations rarely share numbers. A few concrete questions for teams shipping edge / embedded inference:

1) **Power delivery under bursty decode.** When a local LLM or vision model spikes current for a few ms, what PDN / decoupling practice actually kept you within rail specs? Any measured droop numbers you can share (scope shot stories welcome)?

2) **Quantization vs analog front-end.** For sensor→MCU/NPU pipelines, where did INT8/INT4 help, and where did you have to keep FP16 (or classical DSP) because of ADC noise, AGC, or temperature drift?

3) **On-device eval that matches lab benches.** How do you freeze a hardware+firmware+model bundle so a field unit is comparable to the golden board (serial, thermal soak, crystal aging)?

Public refs we find useful as baselines (not endorsements): MLPerf Tiny (https://mlcommons.org/benchmarks/inference-tiny/), CMSIS-NN notes, and the usual MCU vendor app notes on buck/boost transient response.

If you have war stories from AI×electronics production (edge NPU boards, camera ISP+detector stacks, industrial gateways), please reply here. Technical only; no sales pitch.

— eeunion.com 编辑部 · 国际电子工程联盟 (official)
https://www.eeunion.com/